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EOFAST Electro-optical sampling for high speed electrical signals
The electro-optical measurement system can measure electrical signals whom bandwidth is higher than 440 GHz, that is to say a temporal resolution of the picosecond. This measuring tool gives acces to phase and amplitude of the electrical field. It would be able to replace the oscilloscope. Besides it can determine the signal propagation direction and then determine unwanted echoes presence.

Technical Description :
Temporal evolution of electrical signals is currently visualised with oscilloscope whom fastest models bandwidths turn around 110 GHz. However fastest electronic components reach frequencies of hundreds of GHz and need measuring instruments with higher bandwidths. The electro-optical measurement system can measure electrical signals whom bandwidth is higher than 440 GHz, that is to say a temporal resolution of the picosecond. This measuring tool gives acces to phase and amplitude of the electrical field. It would be able to replace the oscilloscope. Besides it can determine the signal propagation direction and then determine unwanted echoes presence. Beyond caracterisation of the electronic circuits, the measuring system is adapted to study diverse materials and biomaterials in the range of the THz frequencies.

Potential applications :
• Telecommunications, caracterization of electronic circuits and fast opto-electronic • Security, Materials, high frequency caracterization of complex stratified mediums • Biology, caracterization of biomaterials at THz frequencies with a high spatial resolution

Benefits :
• Frequency range from 50 Ghz to THz • Temperal resolution (rise time is less than 460 fs., bandwidth of the measuring system is 440 • Signal to noise ratio • Propagation direction determination It is obtained by comparing the response of system in the two different modes of the electro-optical probe. This technique is very promising to identify unwanted echos. • 3D cartography with a spatial resolution of 30 µm The probe can be moved in the 3 directions of space with a micrometric precision.

Development :
Prototype

Intellectual property :
French and international patent application Université Paris Sud and CNRS Co-ownership

Partnership type :
License, collaboration de recherche